Image pickup element, image pickup apparatus, and image pickup system

ABSTRACT

An image pickup element includes a first pixel, a second pixel, and a third pixel that share one microlens, a first boundary that is provided between the first pixel and the second pixel, and a second boundary that is provided between the first pixel and the third pixel, and when a charge amount of the first pixel is saturated, a first charge amount from the first pixel to the second pixel via the first boundary is larger than a second charge amount from the first pixel to the third pixel via the second boundary.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of application Ser. No. 14/087,752,filed Nov. 22, 2013 the entire disclosure of which is herebyincorporated by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to an image pickup element that includes aplurality of pixels sharing one microlens.

2. Description of the Related Art

Previously, an image pickup apparatus that performs a focus detectionbased on a phase difference of two pupil-divided images obtained from animage pickup element including a plurality of pixels sharing onemicrolens has been known. Japanese Patent Laid-open No. 2001-83407discloses an image pickup apparatus that includes an image pickupelement including the plurality of pixels sharing one microlens. Theimage pickup apparatus disclosed in Japanese Patent Laid-open No.2001-83407 may obtain a high-quality image output by performing a focusdetection based on a phase difference of two pupil-divided imagesobtained from the image pickup element and generating an image pickupsignal using an added signal (added charge) of the plurality of pixelssharing one microlens.

However, in the image pickup apparatus disclosed in Japanese PatentLaid-open No. 2001-83407, when each of the divided pixels is saturated,the focus detection and the improvement in image quality may not berealized simultaneously.

BRIEF SUMMARY OF THE INVENTION

The present invention provides an image pickup element, an image pickupapparatus, and an image pickup system capable of achieving a focusdetection and an improvement of an image quality simultaneously.

An image pickup element as one aspect of the present invention includesa first pixel, a second pixel, and a third pixel that share onemicrolens, a first boundary that is provided between the first pixel andthe second pixel, and a second boundary that is provided between thefirst pixel and the third pixel, and when a charge amount of the firstpixel is saturated, a first charge amount from the first pixel to thesecond pixel via the first boundary is larger than a second chargeamount from the first pixel to the third pixel via the second boundary.

An image pickup element as another aspect of the present inventionincludes a first pixel and a second pixel that share a first microlens,a third pixel and a fourth pixel that share a second microlens, a firstboundary that is provided between the first pixel and the second pixel,and a second boundary that is provided between the third pixel and thefourth pixel, and when charge amounts of the first pixel and the thirdpixel are saturated, a first charge amount from the first pixel to thesecond pixel via the first boundary is larger than a second chargeamount from the third pixel to the fourth pixel via the second boundary.

An image pickup apparatus as another aspect of the present inventionincludes the image pickup element and a processor configured to performa correlation calculation based on a signal obtained from at least apartof a plurality of pixels of the image pickup element.

An image pickup system as another aspect of the present inventionincludes an image pickup optical system and the image pickup apparatus.

Further features and aspects of the present invention will becomeapparent from the following description of exemplary embodiments withreference to the attached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A and 1B are configuration diagrams of an image pickup element ineach of embodiments.

FIG. 2 is a diagram illustrating a pixel array of an image pickupelement in Embodiment 1.

FIG. 3 is a block diagram illustrating a configuration of an imagepickup apparatus in each of the embodiments.

FIG. 4 is an explanatory diagram illustrating a case where pixelsreceive light beams at a high image height position in the image pickupelement of Embodiment 1.

FIG. 5 is an explanatory diagram illustrating a case where a charge ofone pixel corresponding to one microlens is saturated in the imagepickup element of Embodiment 1.

FIG. 6 is an explanatory diagram illustrating a case where charges oftwo pixels corresponding to one microlens are saturated in the imagepickup element of Embodiment 1.

FIG. 7 is a diagram illustrating a pixel array of an image pickupelement in Embodiment 2.

FIGS. 8A and 8B are diagrams illustrating an array of pixels having thesame color in the image pickup element in Embodiment 2.

FIG. 9 is an explanatory diagram illustrating a case where pixelsreceive light beams at a high image height position in an image pickupelement of Embodiment 3.

FIG. 10 is a diagram illustrating a pixel array of the image pickupelement in Embodiment 3.

FIGS. 11A and 11B are diagrams illustrating a pixel array of an imagepickup element in Embodiment 4.

FIG. 12 is a diagram illustrating a pixel array of the image pickupelement in Embodiment 4.

FIG. 13A is a cross-sectional view of a main part of the image pickupelement and FIG. 13B is a schematic diagram of a potential in each ofthe embodiment.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Hereinafter, exemplary embodiments of the present invention will bedescribed with reference to the drawings. Furthermore, in the respectivedrawings, the same reference numerals will be given to the samecomponents, and the description thereof will not be repeated.

First of all, referring to FIG. 3, a configuration of an image pickupapparatus 300 in the embodiment will be described. FIG. 3 is a blockdiagram illustrating the configuration of the image pickup apparatus300. Reference numeral 301 denotes a lens unit (an image pickup opticalsystem), reference numeral 302 denotes an image pickup element,reference numeral 303 denotes an A/D converter, and reference numeral304 denotes a saturation detector. Reference numeral 305 denotes animage signal adding portion (an A-B image signal adding portion) whichadds signals obtained from a plurality of pixels sharing one microlens.Reference numeral 306 denotes a signal processor which performs variouskinds of signal processings for the added signal output from the imagesignal adding portion 305. The signal processor 306 outputs the imagedata, obtained by performing various kinds of signal processings, as ashot image.

Reference numeral 307 denotes a use pixel selecting portion (anon-saturated pixel selecting portion) which selects a non-saturatedpixel so as to perform an AF control. Reference numeral 308 denotes animage signal separating portion (an A-B image signal separating portion)which separates an A-image and a B-image. The image signal separatingportion 308 obtains two image signals different from each other.Reference numeral 309 denotes a correlation calculating portion (aprocessor). The correlation calculating portion 309 performs acorrelation calculation based on the signal (an image signal) obtainedfrom at least a part of the plurality of pixels of the image pickupelement 302. Reference numeral 310 denotes a defocus amount calculatingportion. Reference numeral 311 denotes a microcomputer (a controller)which controls an entire system of the image pickup apparatus 300, andreference numeral 312 denotes a ROM (a storage portion) which stores anindividual difference of a saturation level.

The image pickup apparatus 300 of the present embodiment is configuredby integrally including the lens unit 301 (an image pickup opticalsystem), but the embodiment is not limited to this. The presentembodiment can also be applied to an image pickup system that includesan image pickup apparatus body on which an image pickup optical system(a lens apparatus) is removably mounted and the image pickup opticalsystem mounted on the image pickup apparatus body.

Next, referring to FIGS. 1A and 1B, the configuration of the imagepickup element in the present embodiment will be described. FIGS. 1A and1B are configuration diagrams of the image pickup element 302 in thepresent embodiment, and FIG. 1A is a cross-sectional view of a main partof the image pickup element 302 and FIG. 1B is a plan view of a lightreceiving portion 104.

In FIG. 1A, the microlens 101 efficiently collects light beams (incidentlight) onto the light receiving portion 104 (a photoelectric conversionportion). A color filter 102 causes only a light beam of a desiredwavelength band of the incident light to be selectively transmittedtherethrough. Reference numeral 103 denotes a wiring layer of asemiconductor (an image pickup element 302). The light beam passingthrough the color filter 102 is received by the light receiving portion104 (a photodiode) and is photoelectrically converted.

Commonly, the image pickup element 302 includes one light receivingportion 104 (a photodiode) for one microlens 101. However, in thepresent embodiment, the light receiving portion 104 for one microlens101 is divided into two portions so as to obtain a pupil-divided image.For example, in a case where a four-division light receiving portion(four-division pixels) that is divided into two portions in a horizontaldirection and is divided into two portions in a vertical direction isprovided as a multi-division light receiving portion, when two upperpixels are added and two lower pixels are added respectively, an imageequivalent to a pupil-divided image obtained from two divided portionsin the vertical direction can be obtained. On the other hand, when twoleft pixels are added and two right pixels are added in thefour-division pixels respectively, an image equivalent to apupil-divided image obtained by two divided portions in the verticaldirection can be obtained. Accordingly, compared to the two-divisionpixels in the horizontal direction or the vertical direction, thepupil-divided image in both the vertical direction and the horizontaldirection can be simultaneously obtained by the unit of one microlens101.

As illustrated in FIG. 1B, the image pickup element 302 includes thefour-division light receiving portion 104 (pixels 105 to 108) for onemicrolens 101. In the present embodiment, the pixels 105 to 108 includea first pixel, a second pixel, and a third pixel that share onemicrolens 101. Hereinafter, for convenience of the description, thepixels 106, 105, and 108 are referred to as the first pixel, the secondpixel, and the third pixel, respectively, but the present invention isnot limited to this.

The four-division light receiving portion 104 (the pixels) is providedwith a boundary 110 that is configured to actively leak a charge to anadjacent pixel and a boundary 120 that is not configured to activelyleak a charge when a charge amount of each pixel is saturated. Theboundary 110 (a first boundary) is provided between the pixel 106 (afirst pixel) and the pixel 105 (a second pixel) (and between the pixel107 and the pixel 108). Furthermore, the boundary 120 (a secondboundary) is provided between the pixel 106 (the first pixel) and thepixel 108 (a third pixel) (and between the pixel 105 and the pixel 107).

The boundary 110 is configured to allow a movement of a charge from thefirst pixel to the second pixel (for example, the pixel 105) when thecharge amount of the first pixel (for example, the pixel 106) issaturated. On the other hand, the boundary 120 is configured to preventthe movement of the charge from the first pixel to the third pixel (forexample, the pixel 108) when the charge amount of the first pixel (forexample, the pixel 106) is saturated. That is, when the charge amount ofthe pixel 106 is saturated, the charge amount (a first charge amount)moving from the pixel 106 to the pixel 105 via the boundary 110 islarger than the charge amount (a second charge amount) moving from thepixel 106 to the pixel 108 via the boundary 120.

In the configuration illustrated in FIG. 1B, the correlation calculatingportion 309 of FIG. 3 performs a correlation calculation in the verticaldirection (a first direction) by using added charges between the pixel106 (the first pixel) and the pixel 105 (the second pixel) and addedcharges between the pixels 107 and 108.

Next, referring to FIGS. 13A and 13B, an example of structures of theboundaries 110 and 120 will be described. FIG. 13A illustrates across-sectional structure of a main part of the image pickup element 302of the present embodiment, and FIG. 13B is a schematic diagramillustrating a potential with respect to a signal charge of asemiconductor region of FIG. 13A. FIG. 13B illustrates four pixels(photoelectric conversion elements) corresponding to two adjacentmicrolenses 212 a and 212 b, but even in a configuration in which fourpixels share one microlens, the description for the boundaries 110 and120 may be applied.

In FIG. 13A, reference numerals 321 a and 321 b denote color filters.Reference numeral 322 denotes a wiring layer. In the embodiment, threewiring layers are disposed at different heights are illustrated. AP-type semiconductor region 324 and a plurality of N-type semiconductorregions 213 and 214 constitute a PN junction. The P-type semiconductorregion 324 is disposed on a semiconductor region 323. The semiconductorregion 323 is configured by using, for example, a P-type semiconductorsubstrate or an N-type semiconductor substrate.

The pixel (the photoelectric conversion element) includes the N-typesemiconductor regions 213 and 214 and the P-type semiconductor region324. Specifically, the P-type semiconductor region 324 and the N-typesemiconductor regions 213 a and 213 b constitute two pixels(photoelectric conversion elements PD1 and PD2). The P-typesemiconductor region 324 and the N-type semiconductor regions 214 a and214 b constitute two pixels (photoelectric conversion elements PD3 andPD4). Each of the N-type semiconductor regions 213 a, 213 b, 214 a, and214 b is a region in which the potential is low with respect toelectrons, which is a region to collect signal charges. Furthermore, anembedded photodiode may also be configured by disposing the P-typesemiconductor region on an incident surface side of each of the N-typesemiconductor regions 213 a, 213 b, 214 a, and 214 b. The light beamswhich are collected by one microlens 212 a enter the photoelectricconversion elements PD1 and PD2. The light beams which are collected byone microlens 212 b enter the photoelectric conversion elements PD3 andPD4.

A P-type semiconductor region 326 is formed between the N-typesemiconductor regions 213 a and 213 b included in each of thephotoelectric conversion elements PD1 and PD2. The P-type semiconductorregion 326 functions as a potential barrier with respect to electronsbetween the N-type semiconductor regions 213 a and 213 b. The P-typesemiconductor region 326 corresponds to the boundary 110 of FIG. 1B.

The photoelectric conversion elements PD2 and PD3 are disposed so as tobe adjacent to each other, but the light beams which are collected bythe different microlenses 212 a and 212 b enter the respectivephotoelectric conversion elements PD2 and PD3. A P-type semiconductorregion 325 is formed between the N-type semiconductor regions 213 b and214 a included in each of the photoelectric conversion elements PD2 andPD3. The P-type semiconductor region 325 functions as a potentialbarrier with respect to electrons between the N-type semiconductorregion 213 b and the N-type semiconductor region 214 a. The P-typesemiconductor region 325 corresponds to the boundary 120 of FIG. 1B.

In the present embodiment, the impurity concentrations of the P-typesemiconductor region 325 and the P-type semiconductor region 326 are setto be different from each other. Specifically, the P-type impurityconcentration of the P-type semiconductor region 326 is lower than theP-type impurity concentration of the P-type semiconductor region 325.With such a concentration relation, the height of the potential barrierbetween the photoelectric conversion elements PD1 and PD2 can be lowerthan the height of the potential barrier between the photoelectricconversion elements PD2 and PD3.

As illustrated in FIG. 13B, the height of the potential barrier 327between the photoelectric conversion elements PD1 and PD2 is indicatedby h1. The height of the potential barrier 328 between the photoelectricconversion elements PD2 and PD3 is indicated by h2. The height h1 of thepotential barrier between the photoelectric conversion elements PD1 andPD2 is lower than the height h2 of the potential barrier between thephotoelectric conversion elements PD2 and PD3.

In the present embodiment, it is preferred that the P-type impurityconcentration of the P-type semiconductor region 325 constituting thepotential barrier 327 be set at least three times as high as the P-typeimpurity concentration of the P-type semiconductor region 326constituting the potential barrier 328. According to such aconfiguration, it is possible to form substantially the same potentialdifference as the potential (about 26 mV at a room temperature of 27°C.) of the charge. More preferably, the impurity concentration is setten times or more in consideration of the operation temperature range ofthe image pickup apparatus (the image pickup element 302).

In the present embodiment, the impurity concentration of the boundary110 is set to be lower than the impurity concentration of the boundary120, but the present embodiment is not limited to this, and for example,the same effect can be achieved by setting the width of the boundary 110to be narrower than the width of the boundary 120.

Embodiment 1

Next, an image pickup element in Embodiment 1 of the present inventionwill be described. FIG. 2 is a diagram illustrating a pixel array whenthe image pickup element of the embodiment is configured as a monochromesensor. In the present embodiment, boundaries 110 a and 120 acorresponding to one microlens are alternately arranged in thehorizontal direction and the vertical direction with respect toboundaries 110 b and 120 b corresponding to the adjacent microlens. Thatis, the image pickup element of the present embodiment is configured sothat the charge leakage directions in the event of the saturation of thecharge of the pixel are alternated in the horizontal direction and thevertical direction.

In the present embodiment, a first pixel (a pixel 201), a second pixel(a pixel 202), and a third pixel (a pixel 203) are provided so as toshare one microlens. Furthermore, a fourth pixel (a pixel 204), a fifthpixel (a pixel 205), and a sixth pixel (a pixel 206) are provided so asto share the microlens adjacent to the one microlens. A third boundary(a boundary 110 b) is formed between the fourth pixel (the pixel 204)and the fifth pixel (the pixel 205). Furthermore, a fourth boundary (aboundary 120 b) is formed between the fourth pixel (the pixel 204) andthe sixth pixel (the pixel 206).

For example, when a charge amount of the fourth pixel is saturated, acharge amount (a third charge amount) in which the charge moves from thefourth pixel to the fifth pixel via the third boundary is larger than acharge amount (a fourth charge amount) in which the charge moves fromthe fourth pixel to the sixth pixel via the fourth boundary. That is,when the charge amount of the fourth pixel is saturated, the thirdboundary is configured to allow the movement of the charge from thefourth pixel to the fifth pixel. Furthermore, when the charge amount ofthe fourth pixel is saturated, the fourth boundary is configured toprevent the movement of the charge from the fourth pixel to the sixthpixel. Then, the first boundary (the boundary 110 a) and the thirdboundary (the boundary 110 b) are provided in directions different fromeach other (the vertical direction or the horizontal direction).Similarly, the second boundary (the boundary 120 a) and the fourthboundary (the boundary 120 b) are provided in directions different fromeach other.

Subsequently, referring to FIG. 4, the saturation of the charge amountof the pixel will be described. FIG. 4 illustrates a state where lightbeams enter pixels 401 and 402 (light receiving portions) at a highimage height position through the microlens 101. In FIG. 4, the centerof the optical axis is located at the far right side of the pixels 401and 402. Since the light beams generally enter the pixels while beinginclined as it goes to the periphery of the image, the pixel 401receives more light beams, but the pixel 402 scarcely receives lightbeams. For this reason, the pixel 401 (the charge amount of the pixel401) reaches a saturation state earlier than the pixel 402 (the chargeamount of the pixel 402).

<Saturated Pixel as One Pixel>

Next, referring to FIG. 5, a case in which one pixel corresponding toone microlens is a saturated pixel (a right upper pixel is saturated) inthe image pickup element having the pixel array illustrated in FIG. 2will be described. FIG. 5 is an explanatory diagram illustrating a casewhere the charge of one pixel corresponding to one microlens issaturated.

In FIG. 5, each of pixels 501, 505, 509, and 513 is saturated. Thecharge accumulated in the saturated pixel 501 leaks to the pixel 502indicated by the mesh line via the boundary 110 a. On the other hand,the charge of the pixel 501 does not leak to the pixel 503 (and thepixel 504) indicated by the diagonal line due to the existence of theboundary 120 a.

In this case, the charge leaking from the saturated pixel 501 leaks tothe pixel 502, but total charges (a charge amount) of the pixel 501 andthe pixel 502 are maintained without any loss (hereinafter, this stateis called a “non-destructive state”). Further, the charges of the pixel503 and the pixel 504 are not saturated, and there is no influence ofthe charge leaking from another pixel to the pixels 503 and 504. Forthis reason, the added charges that are obtained by adding the chargesof the pixel 503 and the pixel 504 are also non-destructive.Accordingly, the focus detection can be performed by adding the chargeamounts of two upper pixels and two lower pixels and obtaining thepupil-divided image in the vertical direction. In the embodiment, sincethe charge leaks in the horizontal direction, the added charges of thepixel 501 and the pixel 503 and the added charges of the pixel 502 andthe pixel 504 are all destructive, and hence a correct pupil-dividedimage cannot be obtained from the pixels in the horizontal direction.

On the other hand, the charge of the pixel 505 leaks to a pixel 507indicated by the mesh line, but does not leak to pixels 506 and 508indicated by the diagonal line. The charge leaking from the saturatedpixel 505 leaks to the pixel 507, but total charges (a charge amounts)of the pixels 505 and 507 are maintained without any loss. For thisreason, the added charge amount of these two pixels is non-destructive.Further, the charges of the pixels 506 and 508 are not saturated, andthere is no influence of the charge leaking from another pixel. For thisreason, the added charge amount of the pixels 506 and 508 is alsonon-destructive. Accordingly, the focus detection can be performed byadding the charge amounts of the two right pixels and the two leftpixels and obtaining the pupil-divided image in the horizontaldirection. Further, since the charge leaks in the vertical direction,the added charge amount of the pixels 505 and 507 and the added chargeamount of the pixels 506 and 508 are destructive, and hence a correctpupil-divided image cannot be obtained from these pixels in the verticaldirection.

Similarly, the added charge amount of the pixels 509 and 511 and theadded charge amount of the pixels 510 and 512 are non-destructive.Accordingly, the pupil-divided image of the horizontal direction and thevertical direction can be alternately obtained by the unit of themicrolens, and the correlation calculation is performed from thepupil-divided image obtained as described above to calculate the defocusamount. That is, the pupil-divided image of the vertical direction isobtained from the pixels 501 to 504 and the pixels 513 to 516, thepupil-divided image of the horizontal direction is obtained from thepixels 505 to 508 and the pixels 509 to 512, and the respectivecorrelation calculations are performed to calculate the defocus amount.

As described above, since the charge leakage directions are alternatelyset, even when one division pixel for one microlens is saturated, thereis a direction in which the charge is destructive when the charges ofthe adjacent pixels are added in the adjacent microlens. For thisreason, the pupil-divided image of the horizontal direction or thevertical direction can be obtained by alternating one microlens, andhence the focus detection can be performed. In this way, the correlationcalculating portion 309 performs the correlation calculation in a firstdirection (the vertical direction) by using the added charges of thefirst pixel (for example, the pixel 501) and the second pixel (forexample, the pixel 502). Further, the correlation calculating portion309 performs the correlation calculation in a second direction (thehorizontal direction) different from the first direction by using theadded charges of the fourth pixel (for example, the pixel 505) and thefifth pixel (for example, the pixel 507).

Further, the information amount is halved, but the focus detection canbe performed by obtaining the pupil-divided image of the verticaldirection or the horizontal direction just using the pixel that existsin the portion indicated by the diagonal line of FIG. 5 and is notinfluenced by the leaked charge. Further, since the charge leaks, anyloss does not occur in the charge amount of all division pixels. Forthis reason, when the charges of the division pixels are added, thedivision pixels can be used as the pixels having linearity, and hencethe high image quality can be maintained.

<Saturated Pixel as Two Pixels>

Next, referring to FIG. 6, a case in which two pixels corresponding toone microlens are saturated pixels (two upper pixels are saturated) inthe image pickup element having the pixel array illustrated in FIG. 2will be described. FIG. 6 is an explanatory diagram illustrating a casewhere the charges of two pixels corresponding to one microlens aresaturated.

In FIG. 6, pixels 601 and 602 are saturated. However, since the boundary120 a is formed between a group of the pixels 601 and 602 and a group ofpixels 603 and 604, the charge does not leak in upward and downwarddirections (the vertical direction). For this reason, the added chargesof the pixels 601 and 602 are destructive, and hence the pupil-dividedimage of the vertical direction cannot be obtained. Further, the addedcharges of pixels 601 and 603 and the added charges of pixels 602 and604 are also destructive, and hence the pupil-divided image of thehorizontal direction cannot be obtained.

Further, pixels 605 and 606 are also saturated. However, since theboundary 110 b is formed between a group of pixels 605 and 606 and agroup of pixels 607 and 608, the charge leaks in the upward and downwarddirections (the vertical direction). For this reason, the added chargesof pixels 605 and 607 and the added charges of pixels 606 and 608 areall non-destructive, and hence the pupil-divided image of the horizontaldirection can be obtained. On the other hand, since the charges of theadded pixel of the pixels 605 and 606 and the added pixel of the pixels607 and 608 are destructive, the pupil-divided image of the verticaldirection cannot be obtained. Similarly, pixels 615 and 616 indicated bythe diagonal line are non-destructive. In this case, the defocus amountcan be calculated by obtaining the pupil-divided image in the lateraldirection (the horizontal direction) alternating one microlens andperforming the correlation calculation.

In the image pickup element of the present embodiment, the boundaries110 a, 110 b, 120 a, and 120 b are disposed so as to alternate thecharge leakage directions. Then, when both charges of the first pixel(for example, the pixel 601) and the second pixel (for example, thepixel 602) are saturated, the correlation calculation of the seconddirection (for example, the vertical direction) is performed by usingthe added charges of the fourth pixel (for example, the pixel 605) andthe fifth pixel (for example, the pixel 607). For this reason, even whentwo pixels sharing one microlens are saturated pixels, the pixel usedfor the focus detection in one direction (the horizontal direction)exists at a position alternating one microlens. For this reason, thefocus detection can be performed only in one direction. Further, theinformation amount is halved, but the focus detection can be performedby obtaining the pupil-divided image of the vertical direction or thehorizontal direction just using the pixel that exists in the portionindicated by the diagonal line of FIG. 6 and is not influenced by theleaked charge.

Subsequently, a method of using an image signal obtained from aplurality of pixels of the image pickup element as image data will bedescribed. When the pixels 601 and 602 are saturated, a pixel forleaking the charges of the pixels 601 and 602 does not exist around thepixels 601 and 602. For this reason, the linearity of the added chargesof the pixel 601 to 604 is not maintained. On the other hand, thesaturated charges of the pixels 605 and 606 move to the lower pixels 607and 608 adjacent to the pixels 605 and 606. For this reason, thelinearity of the added charges of the pixels 605 to 608 is maintained.

In this way, according to the image pickup element of the presentembodiment, a pixel where the linearity is maintained essentially existsat the pixels corresponding to the adjacent microlens. For this reason,a correction can be performed by estimating an original pixel valueusing the value of the peripheral non-destructive pixel. For example, atleast a part of the charges of the saturated pixels 605 and 606 leak tothe pixels 607 and 608, but total charges of a plurality of dividedpixels 605 to 608 are not lost. For this reason, the added charges ofthe pixels 605 to 608 can be used as the image data.

Accordingly, since the added charges (an added pixel value) of thepixels 601 to 604 can be corrected by obtaining an average value of theadded pixel value of, for example, the pixels corresponding to theadjacent upper, lower, left, and right microlenses, deterioration inimage quality can be prevented. Furthermore, in the present embodiment,the average value of the usable added pixel value corresponding to theupper, lower, left, and right microlenses is used, but the correctionmethod is not limited to this and another correction method may also beused. In the present embodiment, the plurality of pixels are disposed ina predetermined cycle repeated in the two-dimensional direction (thevertical direction and the horizontal direction), but the presentembodiment is not limited to this, and for example, the plurality ofpixels may also be disposed in a predetermined cycle repeated in aone-dimensional direction.

Embodiment 2

Next, referring to FIGS. 7, 8A, and 8B, an image pickup element inEmbodiment 2 of the present invention will be described. FIG. 7 is adiagram illustrating a pixel array (Bayer array) of the image pickupelement in the present embodiment. FIGS. 8A and 8B are diagramsillustrating an array of the pixels of the same color in the imagepickup element, and FIG. 8A illustrates a R-pixel (a red pixel) and FIG.8B illustrates a G-pixel (a green pixel).

The image pickup element illustrated in FIG. 7 includes four-divisionpixels for one microlens, and includes color filters of a plurality ofcolors (RGB). The color filters are arranged as a Bayer array by theunit of the microlens. The amount of the light beam received by thelight receiving portion (the pixel) differs for each color filter. Forthis reason, the charge leakage directions are alternately disposed inthe vertical direction and the horizontal direction between the nearestpixels having the same color. That is, as illustrated in FIG. 7, redpixels (R-pixels 701R and 702R) and blue pixels (B-pixels 701B and 702B)exist in the horizontal direction and the vertical direction so as toalternate one pixel.

As for the nearest pixels having the same color, the charge leakagedirections (the boundaries 110 a and 110 b) are alternately disposed asillustrated in FIG. 8A. Further, green pixels (G-pixels 701G and 702G)are disposed so that two pixels are located obliquely within four pixelsof two by two. Further, as illustrated in FIG. 8B, the charge leakagedirections (boundaries 110 a and 110 b) are disposed so as bealternately changed between the nearest pixels. That is, the imagepickup element of the present embodiment includes a first microlenscorresponding to the color filter having one color among the colorfilters having the plurality of colors and a second microlenscorresponding to the color filter having one color and adjacent to thefirst microlens involved with the color filter having one color. Forexample, in FIGS. 8A and 8B, the first microlens corresponds to themicrolenses corresponding to a R-pixel 801 and a G-pixel 806. Further,the second microlens corresponds to the microlenses corresponding toR-pixels 802 to 805 and G-pixels 807 to 810. In this case, the firstmicrolens is shared by the first pixel, the second pixel, and the thirdpixel, and the second microlens is shared by the fourth pixel, the fifthpixel, and the sixth pixel.

In the present embodiment, when the amount of the light beams receivedby the division pixels at the high image height region is biased so thata part of the division pixels are saturated, the focus detection can beperformed for each pixel having the same color similarly to the methodof Embodiment 1, and thus the image quality can be maintained. Forexample, when the right upper pixel of four pixels sharing one microlensis saturated, the charge of the R-pixel 801 (a red pixel) leaks in thehorizontal direction, but the charges of the nearest pixels (R-pixels802 to 805) leak in the vertical direction. In this case, the samemethod as that of Embodiment 1 can be used when only the R-pixels areconsidered. Regarding the R-pixel 801, the added charges of two adjacentpixels in the horizontal direction are not destructive. For this reason,the defocus amount of the vertical direction can be calculated byperforming the focus detection using the two pixels. Further, thenearest pixels (R-pixels 802 to 805) of the R-pixel 801 becomenon-destructive pixels when adding the charges of two adjacent pixels inthe vertical direction, and the defocus amount of the horizontaldirection can be calculated by using the two pixels. Similarly,regarding the green pixels, the G-pixel 806 becomes a non-destructivepixel when the charges of two adjacent pixels in the horizontaldirection are added. Further, the nearest pixels (G-pixels 807 to 810)of the G-pixel 806 become non-destructive pixels when the charges of twoadjacent pixels in the vertical direction are added. Thus, the defocusamount can be calculated by obtaining the pupil-divided image of thevertical direction or the horizontal direction from these pixels.

In this way, as illustrated in FIG. 7, when the pixels are repeatedlyarranged by four by four in the vertical direction and the horizontaldirection, the AF precision can be maintained even when the divisionpixels are saturated at the high image height position. Further, sincethe linearity of the added charges obtained by adding the charges offour pixels sharing one microlens is maintained, the high image qualitycan be maintained. Furthermore, even when the saturated pixels are twopixels, this case is the same as that of Embodiment 1 when each color isconsidered as described above.

Embodiment 3

Next, referring to FIGS. 9 and 10, an image pickup element in Embodiment3 of the present invention will be described. As described above, sincethe light beams are obliquely incident at a high image height position,for example, the focus detection can also be performed by increasing thenumber of the plurality of pixels (as four or more divided pixels)sharing one microlens and selectively using the pixels to which thelight beams are appropriately incident.

FIG. 9 is an explanatory diagram illustrating a case where pixels at ahigh image height position receive light beams in the image pickupelement of the present embodiment. When the light beams are obliquelyincident at a high image height position, the pixels that receive thelight beams in a less biased state can be used by selecting pixels 902and 903 that receive most of the light beams. The example illustrated inFIG. 9 is a schematic diagram of a left high image height position withrespect to the center of the optical axis. Here, pixels 901 and 902 areselectively used when the high image height position is located at theright side of the center of the optical axis. Further, since the lightbeams are equivalently enter the division pixels in the vicinity of thecenter of the optical axis, the pixels 901 and 903 are selectively used.Furthermore, since the pixels used for the focus detection is away fromthe vicinity of the center of the optical axis, the base length is longand the focus detection precision is improved. On the other hand, whenthe image data (an image pickup signal) is obtained, the charges of allpixels sharing one microlens are added for the image data so as tomaintain the linearity.

FIG. 10 is a diagram illustrating a pixel array of an image pickupelement in the present embodiment. As illustrated in FIG. 10, the imagepickup element of the embodiment includes pixels divided into ninepixels as three by three in the horizontal direction and the verticaldirection for one microlens. In addition, the pixels are arranged sothat the charge leakage directions (boundaries 110 a and 110 b) areperiodically different directions (the vertical direction and thehorizontal direction).

In the pixels located at a high image height position of the left upperside with respect to the center of the optical axis, the saturation ofthe charge easily occurs since the amount of the light beams incident tothe left upper pixels among the nine-division pixels increases. When thecharge of a left upper pixel 1001 among the nine-division pixels issaturated, the charge of the pixel 1001 leaks to an adjacent pixel 1002via the boundary 110 b, but does not leak to another adjacent pixel dueto the existence of the boundary 120 b. When the charge of a pixel 1003is saturated, the charge of the pixel 1003 leaks to a pixel 1004 via theboundary 110 a, but does not leak to another adjacent pixel due to theexistence of the boundary 120 a.

On the other hand, the amount of the light beams incident to the rightlower pixels among the nine-division pixels is small. Accordingly, thefocus detection may be performed by using four pixels which are locatedat the left upper position and to which the light beams areappropriately incident. In this case, the focus detection can beperformed by the same method as that of Embodiment 1 when only fourpixels are considered. That is, since a non-destructive pixelessentially exists in the neighboring pixels of the destructive pixel,the same method as that of Embodiment 1 can be applied. Further, theamount of the light beams incident to the right and the lower pixels issmall, but the linearity as the image is not maintained when thesepixels are not used. For this reason, the added charges of all the ninepixels are used as the image data (the image pickup signal).

In this way, in the present embodiment, the use pixel selecting portion307 (a pixel selecting portion) selects the pixel used for thecorrelation calculation from the plurality of pixels sharing onemicrolens. Then, the correlation calculating portion 309 (a processor)performs the correlation calculation based on the signal obtained fromthe pixel selected by the use pixel selecting portion 307.

Even when two or more pixels among the plurality of pixels sharing onemicrolens are saturated, the same method as that of Embodiment 1 can beapplied. That is, the focus detection is performed by using the signalfrom the non-destructive pixel, and the correction (the interpolation)is performed from the neighboring pixels when the linearity is notmaintained due to the saturated charges of the pixel to be used as theimage data (the image pickup signal).

In the present embodiment, a monochrome sensor (the image pickupelement) is described. However, the present embodiment is not limited tothis, and can also be applied to, for example, an image pickup elementhaving color filters having three colors of a Bayer array. In this case,the method of the present embodiment can be applied in a manner suchthat the charge leakage direction is alternated for each of the adjacentpixels having the same color which is periodically disposed. In thepresent embodiment, the nine-division pixels sharing one microlens aredescribed, but the present embodiment is not limited to this, and forexample, the present embodiment can be applied to an arbitrary number ofdivision pixels.

Embodiment 4

Next, referring to FIGS. 11A, 11B, and 12, an image pickup element inEmbodiment 4 of the present invention will be described. FIGS. 11A and11B are diagrams illustrating a pixel array of the image pickup elementof the present embodiment, which illustrate a configuration in whicheach of two pixels sharing one microlens is divided into two pixels inthe horizontal direction.

FIG. 11A illustrates a configuration of a first pixel (a pixel 1101) anda second pixel (a pixel 1102) sharing a first microlens. Further, theboundary 110 (a first boundary) is provided between the first pixel andthe second pixel. As illustrated in FIGS. 13A and 13B, the boundary 110has a structure in which the charge leaks between two pixels. FIG. 11Billustrates a configuration of a third pixel (a pixel 1103) and a fourthpixel (a pixel 1104) sharing a second microlens. Further, the boundary120 (a second boundary) is provided between the third pixel and thefourth pixel. As illustrated in FIGS. 13A and 13B, the boundary 120 hasa structure in which the charge does not leak (hardly leaks) between twopixels.

In this way, when the charge amount of the first pixel (for example, thepixel 1101) is saturated, the boundary 110 is configured to allow themovement of the charge from the first pixel to the second pixel. On theother hand, when the charge amount of the third pixel (for example, thepixel 1103) is saturated, the boundary 120 is configured to prevent themovement of the charge from the third pixel to the fourth pixel. Thatis, when the charge amounts of the first pixel and the third pixel aresaturated, the first charge amount from the first pixel to the secondpixel via the first boundary is larger than the second charge amountfrom the third pixel to the fourth pixel via the second boundary.

FIG. 12 illustrates a configuration in which two types of pixels (thefirst and second microlenses) illustrated in FIGS. 11A and 11B arealternately arranged two-dimensionally (in the vertical direction andthe horizontal direction). As described above, the amount of the lightbeams received by the division pixels at a high image height region isbiased, so that one of the division pixels is saturated. For example,when a right pixel 1201 of two division pixels is saturated, the chargeof the pixel 1201 does not leak to a left pixel 1202. For this reason,the linearity of the added charges of the pixels 1201 and 1202 are notmaintained. On the other hand, since a charge of a pixel 1203 leaks to apixel 1204, the added charges of the pixels 1203 and 1204 are not lost,so that the linearity is maintained. In the present embodiment, theadded charges of the pixels 1201 and 1202 are destructive, but thedeterioration in image quality can be reduced by using the peripheralpixels (for example, the pixels 1203 and 1204) maintaining thelinearity.

Since the pixel 1202 is a non-destructive pixel, an original charge ofthe pixel 1201 can be obtained by subtracting the charge amount of thepixel 1202 from the added charges (an estimated charge amount) of thepixels 1201 and 1202 estimated from the peripheral pixels. In this case,the saturation detector 304 or the image signal separating portion 308(a charge estimating portion) estimates the charge of a target pixel.For example, when the charge of the third pixel (for example, the pixel1202) or the fourth pixel (for example, the pixel 1201) is saturated,the charge of the third pixel or the fourth pixel is estimated by usingthe added charges of the first pixel (for example, the pixel 1204) andthe second pixel (for example, the pixel 1203).

In this way, in the present embodiment, the pixels (pixels 1201 and1202) that are divided via the boundary 120 for preventing the leakageof the charge exist periodically. For this reason, the AF control can beperformed by using the pixels (pixels 1201 and 1202). Accordingly, sincethe plurality of pixels having different boundaries (boundaries 110 and120) are repeatedly and periodically arranged, the AF control and theimprovement in image quality can be simultaneously performed even whenone of the division pixels is saturated.

According to each of the embodiments described above, even when a partof the pixels among the plurality of pixels sharing one microlens aresaturated, the focus detection can be performed by using the usablepixels among the plurality of pixels. For this reason, an image pickupelement, an image pickup apparatus, and an image pickup system capableof simultaneously achieving the focus detection and the improvement inimage quality can be provided.

While the present invention has been described with reference toexemplary embodiments, it is to be understood that the invention is notlimited to the disclosed exemplary embodiments. The scope of thefollowing claims is to be accorded the broadest interpretation so as toencompass all such modifications and equivalent structures andfunctions.

This application claims the benefit of Japanese Patent Application No.2012-261605, filed on Nov. 29, 2012, which is hereby incorporated byreference herein in its entirety.

What is claimed is:
 1. An image pickup element comprising: a firstpixel, a second pixel, and a third pixel that share one microlens; afirst boundary that is provided between the first pixel and the secondpixel; and a second boundary that is provided between the first pixeland the third pixel, wherein when a charge amount of the first pixel issaturated, a first charge amount from the first pixel to the secondpixel via the first boundary is larger than a second charge amount fromthe first pixel to the third pixel via the second boundary.